Science of Advanced Materials 720

Module: X-ray Diffraction

       General Information and Grading Policies

Fall 2009

Instructor: Dr. Valeri Petkov

232 Dow, phone: 774-3395, e-mail: petkov@phy.cmich.edu

Office hours: Mon. and Tues.11-12 am, or by appointment.

Text: Course materials are attached below

Overview: X-ray diffraction module of SAM 720 is intended for SAM Ph.D., and science and engineering M.S. students. It is a three weeks module - 6 contact hours per week. The module concentrates on teaching students principles of X-ray diffraction, in particular diffraction from polycrystalline and disordered materials as well as giving them hands-on training on x-ray diffraction data collection and interpretation. Students should get acquainted with the course materials for a given week before coming to class. Data analysis requires extensive use of computational procedures. Students may wish to get acquainted with software applications such as Excel and Origin installed on the PC's in Dow 231. Class participation is mandatory, no make-ups are possible.

Grades: Students should submit a comprehensive report on the work they did in the X-ray diffraction module not later than a week after the module is over. Reports will be reviewed first by Dr. Petkov and then forwarded to SAM 720 course coordinator who will compute the final grade for SAM 720.

Week 1

XRD_Fundamentals

XRD_Data_collection

Week 2

Phase_analysis

Crystallite_size

XRD_data_week2

Week 3  

Rietveld_fundamentals

Tutorials_Rietveld

Crystal_structures

PowderCell_Tutorial

XRD_data_week3

pcw23 (download and install on a Windows PC)


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